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dbscan-silicon-defect-detection

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This project uses machine learning to detect anomalies in silicon wafers. It employs DBSCAN clustering and a Gradio interface for user interaction, enabling automated defect detection and enhancing quality control in semiconductor manufacturing

anomaly-detectionclusteringdata-sciencedbscangradiointeractive-visualizationsmachine-learningpython
Creat：2025-04-26T21:50:10
Update：2025-11-16T11:51:46
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